2010 – 2016: Reader (Associate/Full Professor) of Theoretical Computer Science, Middlesex University, UK
2002 – 2009: Assistant Professor, School of Computer Engineering, Nanyang Technological University, Singapore
1999 – 2002: PhD in Computer Science, University of Southampton, UK
1998 – 1999: Research Fellow, Department of Computing, National University of Singapore, Singapore
1987 – 2016: Bachelor, PhD in Mechanical Engineering, Lecturer, Chair Professor, Harbin Institute of Technology, China
Representative Publications
Rahmdel, P. S., D. Shi, R. Comley (2014). Comment on “Collinear Segment Detection Using HT Neighborhoods”, IEEE Transactions on Image Processing, 23(2):952-955.)
Jiang, X., G. Gao, T. Wang and D. Shi (2014). TPSLVM: A Dimensionality Reduction Algorithm based on Thin Plate Splines,, IEEE Transactions on Cybernetics, 44(10):1795-1807.
Shi, D., Gao, J., Rahmdel, P., Antolovich, M. and Clark, T. (2013). UND: Unite-and-Divide Method in Fourier and Radon Domains for Line Segment Detection, IEEE Transactions on Image Processing, 22(6):2500-2505.
Shi, D., L. Zheng, J. Liu (2010), Advanced Hough transform using a fractional Fourier method. IEEE Transactions on Image Processing, 19(6):1558-1566.
Shi, D., and M. N. Nguyen (2010). Fuzzy CMAC with Incremental Bayesian Ying Yang Learning and Dynamic Rule Construction, IEEE Transactions on Systems, Man and Cybernetics, 40(2):548-552.
Nguyen, M. N., D. Shi and C. Quek (2006). FCMAC-BYY: Fuzzy CMAC using Bayesian Ying-Yang learning, IEEE Transactions on Systems, Man and Cybernetics, Part B, 36(5):1180-1190.
Shi, D., D. S. Yeung, J. Gao (2005). Sensitivity analysis applied to the construction of radial basis function network, Neural Networks, 18(7):951-957.
Shi, D., R. I. Damper and S. R. Gunn, (2003a). Off-line handwritten Chinese character recognition by radical decomposition, ACM Transactions on Asian Language Information Processing, 2(1):27-48.
Shi, D., S. R. Gunn and R. I. Damper, (2003). Handwritten Chinese radical recognition using nonlinear active shape models, IEEE Transactions on Pattern Analysis and Machine Intelligence, 25(2):277-280.